日本精品久久久久中文字幕,亚洲一区 日韩精品 中文字幕,熟妇高潮精品一区二区三区,影音先锋女人AV女色资源

How to Use the IP Test Probes?
When testing the protection of persons against hazardous parts on low-voltage equipment, a low-voltage supply in series with a suitable lamp needs to be connected between the probe and the hazardous parts inside the enclosure. After the setup, you are required to push the access probe against or (P2X) inserted through any openings of the enclosure with the specified force listed in the standard you follow.
When testing the protection against the ingress of solid foreign objects, you need to push the object probe against any openings of the enclosure with the given force.

What are the Acceptance Conditions for the Tests Using the lP Test Probes?
For testing the protection of persons against hazardous parts, the protection level is eligible if adequateclearance is kept between the access probe and hazardous parts. The lamp shall not light if verified by a signalcircuit between the probe and hazardous parts. When using the lP1X access sphere, it should not completelypass through the opening
For testing the protection against the ingress of solid foreign objects, the protection level is eliqible if the fulldiameter of the probe doesn't pass through any opening.

Please check the below IP1X/IP2X/IP3X/IP4X Test probes list:

Model/Name	Standard	Specification
BND-A IP1X test probe A	IEC60529  IEC61032  IEC60335 IEC61029  IEC60745  IEC60065 IEC60950	Ball Diameter:50mm Baffle Plate Diameter:45mm Baffle Plate Thickness:45mm Handle Diameter:10mm Handle Length:100mm
BND-AF IP1X test probe A with 50N	IEC60529  IEC61032  IEC60335 IEC61029  IEC60745  IEC60065 IEC60950	Ball Diameter:50mm Baffle Plate Diameter:45mm Baffle Plate Thickness:45mm Handle Diameter:10mm Handle Length:100mm Force :10N/20N/30N/40N/50N.
BND-B IP2X test probe B	IEC61032  IEC60950  IEC60335 IEC60529  IEC60045  IEC60884 IEC60745	Knurled Finger Diameter:12mm Knurled Finger Length:80mm Baffle Plate Diameter:50mm Baffle Plate Length:100mm Baffle Thickness:20mm
BND-BF50 IP2X test probe B with 50N	IEC61032  IEC60950  IEC60335 IEC60529  IEC60045  IEC60884 IEC60745	Knurled Finger Diameter:12mm Knurled Finger Length:80mm Baffle Plate Diameter:50mm Baffle Plate Length:100mm Baffle Thickness:20mm Force :10N/20N/30N/40N/50N.
BND-C IP3X test probe C	IEC61032  IEC60529	Test Probe Length:100mm Test probe Diameter:2.5mm Dam-sphere Diameter:3.5mm Handle Diameter:10mm Handle Length:100mm
BND-CF IP3X test probe C With 3N	IEC60335	Test Probe Length:100mm Test probe Diameter:2.5mm Dam-sphere Diameter:3.5mm Handle Diameter:10mm Handle Length:100mm With force: 3N
BND-D IP4X test probe D	IEC61032  IEC60529	Test Probe Length:100mm Test probe Diameter:1.0mm Dam-sphere Diameter:3.5mm Handle Diameter:10mm Handle Length:100mm
BND-DF IP4X test probe D with 1N	IEC60335	Test Probe Length:100mm Test Probe Diameter:1.0mm/2.5mm Dam-sphere Diameter:35mm Handle Diameter:10mm Handle Length:100mm Force:1N